Scanning Probe MicroscopyWeb Directory

These sites provide methods and techniques used in SPM. Scanning probe microscopes image the surface by scanning the object usually with a sharp tip and piezoelectric feedback. Category includes but is not limited to Scanning Tunneling Microscopes (STM), Atomic Force Microscopes (AFM),Scanning Force Microscopes (SFM)and Scanning Near-Field Optical Microscopes (SNOM).

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