These sites provide methods and techniques used in SPM. Scanning probe microscopes image the surface by scanning the object usually with a sharp tip and piezoelectric feedback. Category includes but is not limited to Scanning Tunneling Microscopes (STM), Atomic Force Microscopes (AFM),Scanning Force Microscopes (SFM)and Scanning Near-Field Optical Microscopes (SNOM).
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- Scanning Tunneling Microscopy Image gallery of metal surfaces, generated at the IBM Almaden Research Center in San Jose, CA.
- SPM Application Using scanning probe microscopy to explore and manipulate semiconductor surfaces. Department of Chemistry at McMaster University.
- Imaging Surfaces on a Fine Scale Description of techniques and applications.
- Conference on Non-Contact AFM August 15-18, 2005 conference in Germany for research on force controlled imaging, spectroscopy and manipulation.
- University of Leuven, Belgium - The SPM Group Scanning Probe Microscopy: introduction, research work, personnel, recent publications (some .pdf), image gallery, equipment, collaborations and links.
- ALB's Webpage Ultra-high optical resolution with tip enhanced microscopy with a parabolic mirror. Includes Apace and MagicSERS, a program for view/convert Winspec SPE-spectra.
- Modern Research and Educational Topics in Microscopy Online edition of this book edited by A Mendez-Vilas and J Diaz.